3.1. Scope#

The modeling of EEE parts for space systems is particularly important since they contribute significantly to reliability of considered systems. In this chapter, the basics for reliability prediction of EEE parts are compiled. These are based on the models of the FIDES approach [NR_EEE_2], which has been customized and extended.

The models are based on a combined approach of physics of failures and data. The models consider temperature, humidity, thermal cycling, vibration, and electrical stress established from the physics of failures of EEE components. The data is used to estimate the basic failure rate of all EEE components. Data originates from in orbit return feedback, from manufacturer data or from data collection of reliability data sources.


This chapter is based on the models proposed in FIDES 2009 [NR_EEE_2]. For some models, a space adaptation has been proposed for consideration; it has been applied in the frame of this study and should be considered for the reliability.space calculations. It is presented in the Rules or Recommendations boxes. Also, after the completion of the NRPM study, a 2021 version of FIDES has been released. The changes are indicated for consideration in the present chapter and for future references, but have not been applied on examples, so should not be considered as part of this version of reliability.space. However, it is possible for the user to apply it as another standard as described in the flow chart presented in Fig. 3.4.1. Some of these changes (for new models in particular) are marked as Propositions in Section 3.4.4.